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Sixth International Conference on Aspect-Oriented Software Development



10th Int’lWorkshop on Aspect-Oriented Modeling
Vancouver, Canada, 13 March 2007

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Call for Papers

Aspect-orientation is a rapidly advancing technology. New and powerful aspect-oriented programming techniques are presented at many international venues every year. However, it is not clear what features of such techniques are "common aspect-oriented concepts" and what features are rather language-specific specialties. Research in aspect-oriented modeling has the potential to help find such common characteristics from a perspective that is at a more abstract level (i.e., programming language-independent).

The Aspect-Oriented Modeling (AOM) Workshop brings together researchers and practitioners from two communities, aspect-oriented software development (AOSD) and software model engineering. This workshop provides a forum for presenting new ideas and discussing the state of research and practice in modeling various kinds of crosscutting concerns at different levels of abstraction. The goals of the workshop are to identify and discuss the impacts of aspect-oriented technologies on model engineering to provide aspect-oriented software developers with general modeling means to express aspects and their crosscutting relationships onto other software artifacts.

Workshop Topics
We are interested in submissions on all topics related to aspects and model engineering including, but not limited to:

Aspect-Oriented Modeling

  • Defining essential characteristics of a crosscutting concern
    that need to be modeled

  • Verification and validation of aspect-oriented models

  • Composition of aspect-oriented models

  • Modeling of aspects at different stages of software development
    (requirements engineering, sw architecture, design, implementation)

  • Application of AOM to modeling notations that are not tied to UML

Aspect-Oriented UML

  • Identification of UML elements that can be used to model aspects

  • Identification of UML elements that can NOT be used to model aspects

  • Aspect-oriented support in UML 2.0

  • Extensions to UML for supporting AOSD

AOSD Method and Tool Support

  • Aspect-oriented and model-based software development methods

  • Using existing UML tools in AOSD life-cycles

  • New tools and extensions to existing tools to support AOM

Aspect-Oriented Modeling Case Studies

  • Detailed examples that demonstrate how a certain concern can be
    modeled during software development throughout the different
    development stages

Model-Oriented AOP and JPM

  • Join point selection at model levels (model based pointcut
    languages, model-based join point description, weaving based on
    model transformation, etc.)

  • MOF, UML, MDA, etc. as a support to the JPM

  • Model based aspect evolution

  • Model weaving: from abstract to low-level

  • Model engineering tools for supporting aspect-oriented techniques

  • Model based aspect interference and composition management

Prospective participants are invited to submit 4-6 page position papers following the ACM Format Guidelines ( to: .
All submissions will be reviewed by members of the program and the organizing committee for quality and relevance. Submissions must be original - papers that have been published previously or that are simultaneously submitted to other workshops still under review are not permitted. Submitted papers must be in PDF format and should be submitted to:

Authors of accepted papers will be invited to submit an extended version of their submissions after the workshop, competing for publication in a JOT special issue on aspect-oriented modeling that will be published in August 2007 (

Submission deadline: January
22, 2007
Notification date: Febrary 5, 2007
Camera Ready deadline: Febrary 28, 2007
Workshop date: March 12, 2007

Omar Aldawud, Lucent Technologies, USA
Walter Cazzola, Univ. of Milano, Italy
Tzilla Elrad, Illinois Institute of Technology, USA
Jeff Gray, University of Alabama at Birmingham, USA
Jörg Kienzle, McGill University, Canada
Dominik Stein, University of Duisburg-Essen, Germany


M. Aks¸it Univ. of Twente, NL
O. Aldawud Lucent Technology, USA
A. v. d. Berg Motorola Labs, USA
W. Cazzola Univ. of Milano, I
T. Cottenier Illinois Inst. of Tech., USA
T. Elrad Illinois Inst. of Tech., USA
R. France Colorado State Univ., USA
S. Ghosh Colorado State Univ., USA
J. Gray UAB, USA
S. Hanenberg Univ. of Duisburg-Essen, D
A. Jackson Trinity College, Ireland
J.-M. J´ez´equel IRISA, F
J. Kienzle McGill University, CA
K. Mens Catholic Univ. of Louvain, B
A. Pierantonio Univ. of Aquila, I
A. Rashid Lancaster University, UK
R. Reddy Rochester Inst. of Tech., USA
D. Stein Univ. of Duisburg-Essen, D
M. V¨olter Consultant for SW Tech., D


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